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For multiple listed items
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System
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img{max-width:100%} Power-One HCAA-60W-A Power Supply Assembly 115 Volts HN24-3
JEOL S20A-1193-0200A/02 Detector PCB Card JVME-AIC JWS-2000 SEM Working Spare For multiple listed itemsJEOL S20A 1193 0200A 02 Detector PCB Card JVME AIC JWS 2000 SEM Working Spare Inventory # CONF 1292 Part No: S20A 1193 0200A 02 Model No: JVME AIC Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Made in Japan This JEOL S20A 1193 0200A 02 Detector PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day